SEM EDS elemental maps and backscattered electron image for sample OREX-803172-0
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Description
Backscattered electron images and energy dispersive X-ray elemental (Mg, Si, S, Fe, O) maps of sample OREX-803172-0 acquired using the JEOL 7600F scanning electron microscope at NASA JSC. This sample is one of the particles on mount OREX-803080-0, which consists of particles embedded in epoxy and dry-polished. The particle fragmented in two upon handling to produce mount OREX-803080-0, and this bundle includes SEM images of both fragments. These maps allow for identification of mineral phases and assessment of the chemical composition across the particle.
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How To Cite
Nguyen, A., 2025. SEM EDS elemental maps and backscattered electron image for sample OREX-803172-0, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/zm0q-3s06 Accessed 2025-12-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.
