Scattering mode nearfield FTIR at the Advanced Light Source beamline 5.4 (SINS) on N-rich organic.
Author
Contributor
Description
Spectra across a small patch of organic partly milled using FIB after placing particle on an Au coated Si chip.
Info
OSIRIS-REx
OREX-800055-124
20241127_NanoIR_LBNL_OREX-800055-124_1
Analytical Methods
Lawrence Berkeley National Laboratory
Advanced Light Source Beamline 5.4
Nanoscale Infrared Mapping
How To Cite
Gainsforth, Z., 2025. Scattering mode nearfield FTIR at the Advanced Light Source beamline 5.4 (SINS) on N-rich organic., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/zgcd-s988 Accessed 2025-12-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.


