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SEM-EDS analysis of OREX-803191-107 polished section.

Author

Akira Tsuchiyama


Contributor


Description

SEM BSE images, EDS elemental maps, and EDS point analysis data of OREX-803191-107 polished section. The analysis datates are 5, 6, 2025 and 30, 6, 2025. These data were obtaned at accelerated voltage of 15 kV.


Info

Mission
OSIRIS-REx
Sample
OREX-803191-107
Session
20260213_FIB-SEM_TU_OREX-803191-107_1

Analytical Methods

Laboratory
Tohoku University
Instrument
(TU) TESCAN S8000X
Technique
Focused ion beam-scanning electron microscopy

How To Cite

Tsuchiyama, A., 2026. SEM-EDS analysis of OREX-803191-107 polished section., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/zbb6-yp60 Accessed 2026-03-16.

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Type

Dataset

Date Created

February 18, 2026

Size

3.38 MB

License
Review Status

Pending External Review


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Funding Sources

This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program, JSPS KAKENHI grant number 25K00022.

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