SIMS data from Cameca ims 1290 instrument at UCLA.
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Description
Secondary ion Mass Spectrometry (SIMS) spot data of sample OREX-803431-100 for nitrogen isotopes using the -CN secondary ion. The grains of aggregate imaged are pressed into an indium metal mount. The session nitrogen isotopic standard was called SAN2 and it has a d15N composition of -1.0‰. SAN2 is a pressed mixture of styrene-acrylonitrile plastic and silica nanopowder (with acetone added and dried for binding after the materials were pressed).
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How To Cite
House, C., 2026. SIMS data from Cameca ims 1290 instrument at UCLA., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/xa7w-sm70 Accessed 2026-10-11.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program. Funding is from the OSIRIS-REx participating scientist program award 80NSSC22K1690 and NASA ICAR Cooperative agreement 80NSSC18M009.
