SEM EDX Silicate and oxide analyses in OREX-803065-0 Registered
Author
Contributor
Description
These are EDX analyses of all larger grains in the section, expressed in oxide weight percent. Analyses were undertaken using a working distance of 6.9mm and 20kV. They were standardised using Co metal and an augite reference. Each analysis was composed of 2M X-ray counts.
Info
OSIRIS-REx
OREX-803065-0
20241122_SEM_NHM_OREX-803065-0_1
Analytical Methods
Natural History Museum
(NHM) Zeiss Ultra Plus SEM
Scanning electron microscopy
Type
Dataset
Date Created
December 3, 2024
Size
10.27 kB
Files
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.