SEM EDX Silicate and oxide analyses in OREX-803065-0
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Description

These are EDX analyses of all larger grains in the section, expressed in oxide weight percent. Analyses were undertaken using a working distance of 6.9mm and 20kV. They were standardised using Co metal and an augite reference. Each analysis was composed of 2M X-ray counts.


Info

Mission
OSIRIS-REx
Sample
OREX-803065-0
Session
20241122_SEM_NHM_OREX-803065-0_1

Analytical Methods

Laboratory
Natural History Museum
Instrument
(NHM) Zeiss Ultra Plus SEM
Technique
Scanning electron microscopy

Type

Dataset

Date Created

December 3, 2024

Size

10.27 kB

License
Review Status

Pending External Review

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Funding Sources

This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.

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