NanoSIMS C and Si analysis of presolar grains identified in polished grain OREX-803170-0
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Description
The NanoSIMS 50L at NASA JSC was used to remeasure C-rich presolar grains identified in polished grain OREX-803170-0 for C and Si isotopes. This was performed by raster ion imaging at < 8 micrometer fields of view. The data were collected with the goal of determining isotopic compositions with greater precision and to constrain the grain phase (i.e., SiC or graphite). Graphite was measured as a C isotopic standard. Si isotopes were normalized to the matrix surrounding a presolar grain.
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How To Cite
Nguyen, A., 2025. NanoSIMS C and Si analysis of presolar grains identified in polished grain OREX-803170-0, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/wfbc-rc89 Accessed 2025-12-05.
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This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.


