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NanoSIMS C and Si analysis of presolar grains identified in polished grain OREX-803170-0

Author

Ann Nguyen


Contributor


Description

The NanoSIMS 50L at NASA JSC was used to remeasure C-rich presolar grains identified in polished grain OREX-803170-0 for C and Si isotopes. This was performed by raster ion imaging at < 8 micrometer fields of view. The data were collected with the goal of determining isotopic compositions with greater precision and to constrain the grain phase (i.e., SiC or graphite). Graphite was measured as a C isotopic standard. Si isotopes were normalized to the matrix surrounding a presolar grain.


Info

Mission
OSIRIS-REx
Sample
OREX-803170-0
Session
20240906_NanoSIMS_JSC-ARES_OREX-803170-0_1

Analytical Methods

Laboratory
NASA Johnson Space Center
Instrument
(JSC-ARES)NanoSIMS 50L
Technique
Nanoscale secondary ion mass spectrometry

How To Cite

Nguyen, A., 2025. NanoSIMS C and Si analysis of presolar grains identified in polished grain OREX-803170-0, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/wfbc-rc89 Accessed 2025-12-05.

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Type

Dataset

Date Created

May 9, 2025

Size

5.11 MB

License
Review Status

Pending External Review


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Funding Sources

This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.

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