TEM analysis of FIB section from OREX-803031 grain.
Author
Contributor
Description
Section was removed from OREX-803031 and then analyzed by STXM. This session is for TEM analysis to characterize the chemical composition of the section. It is mostly imaging and EDS.
How To Cite
Gainsforth, Z., 2024. TEM analysis of FIB section from OREX-803031 grain., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/vkqz-bj72 Accessed 2024-09-12.
Info
Mission
OSIRIS-REx
Sample
OREX-803031-101
Session
20231207_TEM_LBNL_OREX-803031-101_1
Analytical Methods
Laboratory
Lawrence Berkeley National Laboratory
Instrument
TitanX TEM
Technique
Transmission Electron Microscopy
Files
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Funding Sources
NASA
