Backscattered and secondary electron images of olivine grains in the polished section.
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Description
These are SEM images of olivine grains from OREX-603065-0 taken using the Zeiss ultraplus showing also acquisition points from EDX analyses. This session was undertaken after NanoSIMS analysis so the ion probe pits are also visible.
Info
OSIRIS-REx
OREX-803065-0
20241122_SEM_NHM_OREX-803065-0_1
Analytical Methods
Natural History Museum
(NHM) Zeiss Ultra Plus SEM
Scanning electron microscopy
How To Cite
Russell, S., 2025. Backscattered and secondary electron images of olivine grains in the polished section., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/vdtj-6751 Accessed 2025-12-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.
