Backscattered and secondary electron images of olivine grains in the polished section.
Author
Contributor
Description
These are SEM images of olivine grains from OREX-603065-0 taken using the Zeiss ultraplus showing also acquisition points from EDX analyses. This session was undertaken after NanoSIMS analysis so the ion probe pits are also visible.
Mission
OSIRIS-REx
Sample
OREX-803065-0
Session
20241122_SEM_NHM_OREX-803065-0_1
How To Cite
Russell, S., 2025. Backscattered and secondary electron images of olivine grains in the polished section., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/vdtj-6751 Accessed 2026-10-04.
Analytical Method
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.
