NANO SCALE THERMAL CONDUCTIVITY CONTRAST MEASUREMENTS OF BENNU SAMPLE OREX-800055-9 USING AN ATOMIC FORCE MICROSCOPE Draft DOI
Author
Description
An Atomic Force Microscope (Park NX10) has been used to measure surface height (Z) and thermal conductivity variations of a sample OREX-800055-9. Images are created using Conductivity Contrast Mode. Measured forward current is proportional to sample thermal conductivity. These images are our first look at the sample and therefor may not have been collected under optimal conditions. Latter images may have different collection parameters.
Info
OSIRIS-REx
Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program. Additional funding provided by the Canadian Space Agency to support researchers Daly, Freemantle and Wilson.
