TEM analysis of FIB section from OREX-803031 grain.


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Description

Section was removed from OREX-803031 and then analyzed by STXM. This session is for TEM analysis to characterize the chemical composition of the section. It is mostly imaging and EDS.


Info

Mission
OSIRIS-REx
Sample
OREX-803031-101
Session
20231207_TEM_LBNL_OREX-803031-101_1

Analytical Methods

Laboratory
Lawrence Berkeley National Laboratory
Instrument
TitanX TEM
Technique
Transmission Electron Microscopy

How To Cite

Gainsforth, Z., 2024. TEM analysis of FIB section from OREX-803031 grain., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/paew-w760 Accessed 2025-03-14.

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Type

Dataset

Date Created

February 10, 2024

Size

4.20 MB

License
Review Status

Pending External Review


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Funding Sources

NASA

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