Sample preparation of particles of OREX-501070-0 by focussed ion beam milling scanning electron microscopy (FEB-SEM) at Curtin University, Western Australia.
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Description
Focussed ion beam milling sample preparation of particles of OREX-501070-0 to reveal particle interiors and as a fluid-free approach for the preparation of flat, damage-free surfaces for subsequent microbeam analyses. The dataset comprises secondary electron images of particles in plan- and profile view collected before, during, and after focussed ion beam milling.
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Analytical Methods
How To Cite
Timms, N., 2024. Sample preparation of particles of OREX-501070-0 by focussed ion beam milling scanning electron microscopy (FEB-SEM) at Curtin University, Western Australia., Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/jty6-p408 Accessed 2025-03-14.
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20231115_FIB-SEM_CUWA_OREX-501070-0_1_SEMImageMap_4.tif
20231115_FIB-SEM_CUWA_OREX-501070-0_1_methodDescription_1.pdf
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Funding Sources
Science and Industry Endowment Fund (SIEF); Space Science and Technology Centre and the John de Laeter Centre at Curtin University.
