Synchrotron based XRF analysis of samples OREX-800045-123 corresponding to parent sample OREX-800045-101
Description
High energy synchrotron XRF performed with submicron spatial resolution on sample OREX-800045-123 corresponding to parent sample OREX-800045-101. The experiment focused on the detection and mapping of REE with 90 keV nanobeam XRF with a spatial resolution of 0.6 micron.
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Analytical Methods
How To Cite
Tkalcec, B., Vincze, L., Herthogs, J., Baert, T., 2026. Synchrotron based XRF analysis of samples OREX-800045-123 corresponding to parent sample OREX-800045-101, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/ga9n-4t31 Accessed 2026-05-21.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program. The synchrotron experiments were supported by ESRF Long Term Project nr. ES-1018; Funds for Scientific Research (FWO), Belgium, Research Project nr. G0D5221N.
