SEM EDX Sulfide analyses in section OREX-803066-0
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Description
These are EDX sulfide analyses of coarse (>10 micron) grains in the section, expressed in wt.%. Analyses were undertaken using a working distance of 8.5mm and 20kEV. They were standardised using Co metal and an augite reference.
Info
OSIRIS-REx
OREX-803066-0
20240408_SEM_NHM_OREX-803066-0_1
Analytical Methods
Natural History Museum
(NHM) Zeiss EVO 15LS SEM
Scanning electron microscopy
How To Cite
Harrison, C., 2024. SEM EDX Sulfide analyses in section OREX-803066-0, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/e10q-c912 Accessed 2025-03-14.
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20240408_SEM_NHM_OREX-803066-0_1_SEMEDSPointData_182.xlsx
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.
