TEM imaging and SAED analysis of OREX-803267-102
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Description
TEM imaging and SAED patterns obtained from OREX-803267-102 ultra-thin section. The analysis date is 19, 2, 2025. The BF-TEM images and SAED patterns were obtained using JEOL JEM-2100F TEM operated at 200 kV.
Info
OSIRIS-REx
OREX-803267-102
20260208_TEM_Rits_OREX-803267-102_1
Analytical Methods
Ritsumeikan University
JEOL JEM-2100F
Transmission Electron Microscopy
How To Cite
Tsuchiyama, A., 2026. TEM imaging and SAED analysis of OREX-803267-102, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/dedw-7g26 Accessed 2026-04-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program, JSPS KAKENHI grant numbers 20H00205 and 20H05846, and the government budget of Hayabusa2 extended mission.
