TEM imaging and SAED analysis of OREX-803191-103
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Description
TEM imaging and SAED patterns obtained from OREX-803191-103 ultra-thin section. The analysis date is 20, 2, 2026. The BF-TEM images and SAED patterns were obtained using JEOL JEM-ARM200F TEM operated at 200 kV.
Info
OSIRIS-REx
OREX-803191-103
20260220_TEM_TU_OREX-803191-103_1
Analytical Methods
Tohoku University
(TU) JEM-ARM200F
Transmission Electron Microscopy
How To Cite
Tsuchiyama, A., 2026. TEM imaging and SAED analysis of OREX-803191-103, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/b52m-f546 Accessed 2026-04-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program and JSPS KAKENHI grant number 25K0022.





