Synchrotron based XRF analysis of samples OREX-800045-124, OREX-800045-125 and OREX-800045-126 corresponding to parent sample OREX-800045-101
Description
High energy synchrotron XRF performed with submicron spatial resolution on samples OREX-800045-124, OREX-800045-125 and OREX-800045-126 corresponding to parent sample OREX-800045-101. The experiment focused on the detection and mapping of REE with 90 keV nanobeam XRF with a spatial resolution of 0.5 micron.
Info
Analytical Methods
How To Cite
Tkalcec, B., Vincze, L., Herthogs, J., Baert, T., 2026. Synchrotron based XRF analysis of samples OREX-800045-124, OREX-800045-125 and OREX-800045-126 corresponding to parent sample OREX-800045-101, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/79pg-k921 Accessed 2026-05-21.
Files
Select a file for preview.
Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program. The synchrotron experiments were supported by ESRF Long Term Project nr. ES-1018; Funds for Scientific Research (FWO), Belgium, Research Project nr. G0D5221N.
