NanoSIMS C and Si, or O and Si analysis of presolar grains identified in polished grain OREX-803172-0
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The NanoSIMS 50L at NASA JSC was used to remeasure presolar grains identified in polished grain OREX-803172-0 for C and Si isotopes (for C-rich presolar grains) or O and Si isotopes (for O-rich presolar grains). This was performed by raster ion imaging at < 8 micrometer fields of view. The data were collected with the goal of determining isotopic compositions with greater precision and to constrain the grain phase (i.e., SiC or graphite, silicate or oxide). San Carlos Olivine was measured as an O isotopic standard, and graphite was measured as a C isotopic standard. Si isotopes were normalized to the matrix surrounding a presolar grain.
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How To Cite
Nguyen, A., 2025. NanoSIMS C and Si, or O and Si analysis of presolar grains identified in polished grain OREX-803172-0, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/0shp-8696 Accessed 2025-12-05.
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Funding Sources
This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program.


